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Tag Archives: TBI

Towards a More Efficient Test Paradigm

Written by Dr. Thomas Di Stefano on July 7, 2010 — Leave a Comment

There is a growing consensus that test and burnin (TBI) requires a new approach. SEMI’s CAST consortium is just the latest attempt to bring focus to an aspect of this looming problem.

Posted in Front Page, Microconnections | Also tagged MEMS, semiconductor test, standard tray format, strip testing, test and burin, test in tray, TnT, TSV, WLP

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