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Attending Semicon?

Written by Dr. Thomas Di Stefano on July 14, 2010 — Leave a Comment

The Test In Tray User Group is a highlight of the test solutions session at 10:30 on July 16 in North Hall.

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  • 2011 SEMI Award for North America Given to Thomas DiStefano, John W. Smith, Jr. and Michael Warner for Chip Scale Packaging Technology
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