Monthly Archives: July, 2010
Attending Semicon?
The Test In Tray User Group is a highlight of the test solutions session at 10:30 on July 16 in North Hall.
Towards a More Efficient Test Paradigm
There is a growing consensus that test and burnin (TBI) requires a new approach. SEMI’s CAST consortium is just the latest attempt to bring focus to an aspect of this looming problem.
Lights out!
Many anticipate that the next upturn in the semiconductor industry is around the corner. But when? And how? At some level we understand that each successive cycle entails new approaches and methods, winners and losers.
Could you have known your product had a fatal flaw?
Our lives in a complex world are increasingly dependent upon ubiquitous electronic devices, many of which are prone to unpredictable failure, leading in some cases to catastrophic losses.